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ON Semiconductor |
IC RECEIVER/DRVR DIFF ECL 8-DFN |
в производстве | Differential Receiver/Driver | 2.375 V ~ 3.8 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 8-VFDFN Exposed Pad | 8-DFN (2x2) |
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Texas Instruments |
IC Regulators BUFFER 13-26BIT 64-TSSOP |
в производстве | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | SMD Поверхностный монтаж | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP |
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Texas Instruments |
IC Regulators BUFF 26BIT SSTL 56-VQFN |
в производстве | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | SMD Поверхностный монтаж | 56-VFQFN Exposed Pad | 56-VQFN (8x8) |
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Texas Instruments |
IC Regulators BUFFER 13-26BIT 64-TSSOP |
в производстве | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | SMD Поверхностный монтаж | 64-TFSOP (0.240", 6.10mm Width) | 64-TSSOP |
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Texas Instruments |
IC Regulators BUFFER 13-26BIT 56-VQFN |
в производстве | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 13, 26 | 0°C ~ 70°C | SMD Поверхностный монтаж | 56-VFQFN Exposed Pad | 56-VQFN (8x8) |
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MICROSS/On Semiconductor |
DIE ARITHMETIC LOGIC UNIT |
в производстве | - | - | - | - | - | - | - |
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MICROSS/On Semiconductor |
DIE ARITHMETIC LOGIC UNIT |
в производстве | - | - | - | - | - | - | - |
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Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
в производстве | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC REGISTERING CLOCK DVR 176-BGA |
устарелый | 1:2 Registered Buffer with Parity | 1.425 V ~ 1.575 V | 28, 56 | 0°C ~ 85°C | SMD Поверхностный монтаж | 176-TFBGA | 176-NFBGA (13.5x8) |
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Texas Instruments |
IC MEMORY DECODER 20SOIC |
в производстве | Memory Decoder | 4.5 V ~ 5.5 V | - | 0°C ~ 75°C | SMD Поверхностный монтаж | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC |
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IDT, Integrated Device Technology Inc |
IC BUFFER 28BIT 12 Regulators 160-BGA |
в производстве | 1:2 Registered Buffer with Parity | 1.7 V ~ 1.9 V | 28 | 0°C ~ 70°C | SMD Поверхностный монтаж | 160-LFBGA | 160-CABGA (9x13) |
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Texas Instruments |
IC DIODE ARRAY RC TERM 20-SOIC |
в производстве | Schottky Barrier Diode Bus-Termination Array | - | 16 | 0°C ~ 70°C | SMD Поверхностный монтаж | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC |
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Texas Instruments |
IC SCHOTTKY BARRIER DIODE 20SOIC |
в производстве | Schottky Barrier Diode Bus-Termination Array | - | 16 | 0°C ~ 70°C | SMD Поверхностный монтаж | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC |
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Texas Instruments |
IC 18BIT UNIV BUS TXRX 64-LQFP |
в производстве | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | SMD Поверхностный монтаж | 64-LQFP | 64-LQFP (10x10) |
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IDT, Integrated Device Technology Inc |
IC BUFFER 14BIT Regulators DDR2 150-BGA |
в производстве | 1:2 Registered Buffer with Parity | 1.7 V ~ 1.9 V | 14 | 0°C ~ 70°C | SMD Поверхностный монтаж | 150-TFBGA | 150-CABGA (8x13) |
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ON Semiconductor |
IC RCVR/DRVR 5V DIFF ECL 8-DFN |
в производстве | Differential Receiver/Driver | 3 V ~ 5.5 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 8-VFDFN Exposed Pad | 8-DFN (2x2) |
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Texas Instruments |
IC SYNC 6BIT BIN RATE MULT 16DIP |
в производстве | Binary Rate Multiplier | 4.75 V ~ 5.25 V | 6 | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE 24SOIC |
в производстве | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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ON Semiconductor |
IC RCVR/DRVR 5V DIFF ECL 8-TSSOP |
в производстве | Differential Receiver/Driver | 3 V ~ 5.5 V | 1 | -40°C ~ 85°C | SMD Поверхностный монтаж | 8-TSSOP, 8-MSOP (0.118", 3.00mm Width) | 8-TSSOP |
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IDT, Integrated Device Technology Inc |
IC REGIST BUFF 28BIT DDR2 96-BGA |
в производстве | Registered Buffer for DDR2 | 1.7 V ~ 1.9 V | 28 | 0°C ~ 70°C | SMD Поверхностный монтаж | 96-LFBGA | 96-CABGA (13.5x5.5) |
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Microchip Technology |
TXRX 3.2GBPS CML/LVPECL 24-MLF |
в производстве | CML/LVPECL Backplane Transceiver w/ Integrated Loopback | 3 V ~ 3.6 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-VFQFN Exposed Pad, 24-MLF® | 24-MLF® (4x4) |
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Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
в производстве | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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ON Semiconductor |
IC HEX BOUNCE ELIMINATOR 16SOIC |
в производстве | Contact Bounce Eliminator | 3 V ~ 18 V | 6 | -55°C ~ 125°C | SMD Поверхностный монтаж | 16-SOIC (0.295", 7.50mm Width) | 16-SOIC |
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Texas Instruments |
IC 20BIT UNIV BUS TXRX 64-LQFP |
в производстве | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | SMD Поверхностный монтаж | 64-LQFP | 64-LQFP (10x10) |
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ON Semiconductor |
IC DRVR/RCVR/BUFF/XLATOR 16-QFN |
в производстве | Receiver, Driver, Buffer, Translator | 3 V ~ 3.6 V | 2 | -40°C ~ 85°C | SMD Поверхностный монтаж | 16-VFQFN Exposed Pad | 16-QFN (3x3) |
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ON Semiconductor |
IC COPPER/CABLE DVR PROG 16-QFN |
в производстве | CML Driver with Selectable Equalizer Receiver | 1.71 V ~ 2.625 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 16-VFQFN Exposed Pad | 16-QFN (3x3) |
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Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
в производстве | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | SMD Поверхностный монтаж | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
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Texas Instruments |
IC 10-BIT SCAN PORT XCVR 24-SOIC |
в производстве | Addressable Scan Ports | 2.7 V ~ 3.6 V | 10 | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC 16BIT I-WS BUS TXRX 48-SSOP |
в производстве | Incident-Wave Switching Bus Transceivers | 4.5 V ~ 5.5 V | 16 | -40°C ~ 85°C | SMD Поверхностный монтаж | 48-BSSOP (0.295", 7.50mm Width) | 48-SSOP |
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ON Semiconductor |
IC LINE RECEIVER QUINT 28-PLCC |
в производстве | Differential Receiver | 4.2 V ~ 5.7 V | 5 | 0°C ~ 85°C | SMD Поверхностный монтаж | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) |
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ON Semiconductor |
IC LINE RECEIVER QUINT 28-PLCC |
в производстве | Differential Receiver | 4.2 V ~ 5.7 V | 5 | 0°C ~ 85°C | SMD Поверхностный монтаж | 28-LCC (J-Lead) | 28-PLCC (11.51x11.51) |
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Texas Instruments |
HI-REL DEVICE |
устарелый | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 24, 48 | -40°C ~ 85°C (TA) | SMD Поверхностный монтаж | 114-LFBGA | 114-BGA MICROSTAR (16x5.5) |
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Texas Instruments |
IC 4BIT BINARY FULL ADDER 16-DIP |
в производстве | Binary Full Adder with Fast Carry | 4.75 V ~ 5.25 V | 4 | 0°C ~ 70°C | Through Hole | 16-DIP (0.300", 7.62mm) | 16-PDIP |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
в производстве | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TEST-BUS CONTROLLER 24-SOIC |
в производстве | Embedded Test-Bus Controllers | 2.7 V ~ 3.6 V | 8 | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
Texas Instruments |
IC BUFFER 24BIT-48BIT 114BGA |
в производстве | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3 V ~ 2.7 V | 24, 48 | 0°C ~ 70°C | SMD Поверхностный монтаж | 114-LFBGA | 114-BGA MICROSTAR (16x5.5) |
|
Texas Instruments |
IC LINK ADDRSS SCAN-PORT 64-BGA |
в производстве | Linking Addressable Scan Ports | 2.7 V ~ 3.6 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 64-LFBGA | 64-BGA MICROSTAR (8x8) |
|
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
в производстве | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 18 | -40°C ~ 85°C | SMD Поверхностный монтаж | 64-LQFP | 64-LQFP (10x10) |
|
ON Semiconductor |
IC RCVR/DRVR ECL DIFF 5V 8TSSOP |
в производстве | Differential Receiver/Driver | 3 V ~ 5.5 V | 1 | -40°C ~ 85°C | SMD Поверхностный монтаж | 8-TSSOP, 8-MSOP (0.118", 3.00mm Width) | 8-TSSOP |
|
Texas Instruments |
IC SCAN-TEST-DEV/XCVR 64-LQFP |
в производстве | ABT Scan Test Device With Universal Bus Transceivers | 2.7 V ~ 3.6 V | 20 | -40°C ~ 85°C | SMD Поверхностный монтаж | 64-LQFP | 64-LQFP (10x10) |
|
ON Semiconductor |
IC CML DVR PRE-EMPH 1CH 16-QFN |
в производстве | CML Driver with Selectable Equalizer Receiver | 1.71 V ~ 2.625 V | - | -40°C ~ 85°C | SMD Поверхностный монтаж | 16-VFQFN Exposed Pad | 16-QFN (3x3) |
|
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
в производстве | Scan Test Device with Inverting Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
в производстве | Scan Test Device with D-Type Latches | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC REGISTERED BUFFER 160-TFBGA |
в производстве | 1:2 Registered Buffer with Parity | 1.7 V ~ 1.9 V | 28 | -40°C ~ 85°C | SMD Поверхностный монтаж | 160-TFBGA | 160-NFBGA (9x13) |
|
ON Semiconductor |
IC DRV/RCV ECL QUAD DIFF 20TSSOP |
в производстве | Differential Receiver/Driver | 2.375 V ~ 3.8 V | 4 | -40°C ~ 85°C | SMD Поверхностный монтаж | 20-TSSOP (0.173", 4.40mm Width) | 20-TSSOP |
|
ON Semiconductor |
IC DRVR ECL QUAD 2.5V/3.3V 24QFN |
в производстве | Differential Receiver/Driver | 2.375 V ~ 3.8 V | 4 | -40°C ~ 85°C | SMD Поверхностный монтаж | 24-VFQFN Exposed Pad | 24-QFN (4x4) |
|
Texas Instruments |
IC SCAN TEST DEVICE 28-SSOP |
в производстве | Scan Test Device with Bus Transceiver and Registers | 4.5 V ~ 5.5 V | 8 | -40°C ~ 85°C | SMD Поверхностный монтаж | 28-BSSOP (0.295", 7.50mm Width) | 28-SSOP |
|
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-SOIC |
в производстве | Scan Test Device with Bus Transceivers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC REGISTERED TXRX 8BIT 52QFP |
в производстве | TTL/BTL Registered Transceiver | 4.75 V ~ 5.25 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 52-QFP | 52-QFP (10x10) |
|
Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
в производстве | Scan Test Device with Buffers | 4.5 V ~ 5.5 V | 8 | 0°C ~ 70°C | SMD Поверхностный монтаж | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |